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S neox Optical Profiler

Dec 2013
Sensofar MetrologyRequest Info
TERRASSA, Spain, Aug. 15, 2013 — Sensofar-Tech SL’s S neox optical profiler achieves vertical and lateral resolutions of 0.01 nm and 0.1 µm, respectively, using 3-D confocal and interferometry (phase shifting and vertical scanning) techniques in the same single-sensor head.

The instrument can acquire 3-D microscopy images as well as thickness measurements of any transparent coatings on the surface. Its high-resolution CCD sensor provides a 50% larger field of view compared with previous models, combined with high-resolution displays for sharp, crystal-clear and vivid images on-screen and without scaling.

For high-speed applications and low-reflective surfaces, full 3-D scans can be acquired in <3 s. New CF60-2 Nikon objective lenses provide a large working distance for each numerical aperture.

Applications include automated measurement and analysis tasks in production lines, and noninvasive assessments of the micro- and nanogeometry of technical surfaces in multiple configurations. The device is ISO 25178-compliant.


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3-D confocal microscopyautomated analysisautomated measurementBiophotonicsBreakthroughProductsCCDCCD sensorCF60-2coatingsConsumerDisplaysEuropeimaginginterferometersISO 25178lateral resolutionlensesmicrogeometry of technical surfacesMicroscopynanogeometry of technical surfacesNikonobjective lensesoptical profileropticsphase-shifting interferometryProductsPSIS neoxSensofar-TechSensors & Detectorssingle-sensor headSpainTest & MeasurementVertical Resolutionvertical-scanning interferometryVSI

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