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20/30 XL Microspectrophotometer

Photonics.com
Sep 2013
CRAIC TechnologiesRequest Info
 
SAN DIMAS, Calif., Sept. 3, 2013 — Craic Technologies has introduced the 20/30 XL microspectrophotometer for taking spectra and images of microscopic features of large objects from the deep-UV to the near-infrared. Its various laboratory and manufacturing applications include mapping color and intensity variations of flat panel displays, measuring film thickness across the entire surface of 300-mm wafers, scanning the surfaces of hard disks for defects, and analyzing entire paintings with high spatial resolution.

The instrument integrates advanced spectrophotometers with a UV-VIS-NIR microscope and software. Its flexible design attaches to big frames that can accommodate large-scale samples. The spectral range of the device enables it to analyze samples using spectroscopy techniques such as absorbance, reflectance, Raman, luminescence and fluorescence.


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20/30 XL microspectrophotometerabsorbance spectroscopyAmericasartwork analysisCaliforniacolor mappingConsumerCraig TechnologiesDisplaysflat panel displaysflexible displaysfluorescence spectroscopyhard disk scanningimagingindustriallight sourcesluminescence spectroscopyMicroscopyopticsProductsRaman spectroscopyreflectance spectroscopywafer measurementWafers

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