Request InfoCRAIC TechnologiesSAN DIMAS, Calif., Sept. 3, 2013 — Craic Technologies has introduced the 20/30 XL microspectrophotometer for taking spectra and images of microscopic features of large objects from the deep-UV to the near-infrared. Its various laboratory and manufacturing applications include mapping color and intensity variations of flat panel displays, measuring film thickness across the entire surface of 300-mm wafers, scanning the surfaces of hard disks for defects, and analyzing entire paintings with high spatial resolution. The instrument integrates advanced spectrophotometers with a UV-VIS-NIR microscope and software. Its flexible...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra January 2024 IssueArc Flash Safety Testing ToolsThe series of thermal imaging and wireless testing tools from Fluke include the PQ400, CV400 ClirVu, TiS75+, 376 FC, and 3000FC for arc flash safety. 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