LumiMap Electroluminescence System
Nov 2013Bruker Nano SurfacesRequest Info
TUCSON, Ariz., Sept. 8, 2013 — Bruker Corp. has introduced the LumiMap electroluminescence system for optical and electrical characterization on epitaxial (epi) growth wafers for high-brightness (HB) LEDs.
An alternative to conventional indium dot methods of epi wafer characterization, the system features nondestructive measurement requiring no chemical cleaning afterward; software-controlled measurement locations; and repeatable optical and electrical measurement capabilities through forming a temporary LED device on an epi wafer. The results correlated with those on the final HB-LED, providing an early warning of process shifts, which in turn reduces scrap.