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Zurich Instruments AG - Boost Your Optics 1-24 LB

JSM-IT300LV Scanning Electron Microscope

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JEOL USA Inc.
The JSM-IT300LV scanning electron microscope (SEM) from JEOL USA features an expanded pressure range, large specimen chamber and improved resolution for imaging and characterizing a variety of sample types and sizes. The SEM extends vacuum pressure range to 10 to 650 pA; in low-vacuum mode, this enhances imaging capability for samples that are wet or oily, that outgas excessively or that are nonconductive without pretreatment. The device features multiple ports for analytical attachments such as energy-dispersive x-ray spectrometers, electron backscatter diffraction,...See full product

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