Sarfus Mapping Nanoscale Microscopy
Sep 2013NanolaneRequest Info
LE MANS, France, Sept. 26, 2013 — Nanolane is offering its latest generation of Sarfus Mapping stations for label-free, real-time nanoscale life sciences imaging. Sarfus Mapping LR is designed for analyses in air, and Sarfus Mapping HR is suitable for advanced research studies in air and liquid.
The mapping stations are complete turnkey systems including instrument, software and PC. Based on surface-enhanced ellipsometric contrast microscopy, they not only track surface changes but also offer live visualization with high lateral resolution and thickness measurements from 0.1 to 300 nm. They offer repeatability of 0.3 nm according to ISO standard 17025.
The systems can be used for topographic analysis of nanometric films and patterns in air and liquid; research on molecular adsorption or desorption, and the buildup or degradation of biofilms; and kinetics studies of films’ morphological changes vs. time, temperature and pH.