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High-Speed AFM

Mar 2014
JPK Instruments AGRequest Info
BERLIN, Dec. 12, 2013 — JPK Instruments AG’s next-generation NanoWizard Ultra Speed AFM (atomic force microscope) delivers fast scanning and superresolution on an inverted microscope for applications including the study of biological or other soft-matter systems.

The device provides real-time tracking changes in samples imaged in air or liquid. Its low-noise scanner, position sensor and detection system enable line-rate scanning speeds >100 Hz in closed-loop mode, while a proprietary Quantitative Imaging mode provides quantitative material property mapping.

A tip-scanning design and proprietary DirectOverlay mode allow the system to be fully integrated with an inverted optical microscope. Measurements can be made on single molecules or on living cells.


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AFMatomic force microscopyBiophotonicsEuropeGermanyimaginginverted microscopeJPK Instrumentslive cell imagingMicroscopyNanoWizard atomic force microscopeNanoWizard Ultra Speed AFMopticsProductsQuantitative ImagingsuperresolutionTest & Measurement

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