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Atomic Spectrometer

Industrial Photonics
Oct 2014

 
SANTA CLARA, Calif., July 29, 2014 — With dual-view analysis, the Agilent 5100 Inductively Coupled Plasma-Optical Emission Spectrometer (ICP-OES) from Agilent Technologies analyzes samples 55 percent faster while using 50 percent less gas per sample than other competitive systems.

The system’s dichroic spectral combiner and synchronous vertical dual-view technology requires only measurement per sample for efficient operation.

All wavelengths can be captured in one measurement, with the spectrometer’s vertical torch enabling the measurement of challenging samples like high matrix or volatile organic solvents.

Applications include food, environmental and pharmaceutical testing, as well as mining and industrial uses.


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