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Thermal Analyzer

Photonics Spectra
Dec 2014
Microsanj LLCRequest Info
SANTA CLARA, Calif., Oct. 1, 2014 — A new optical thermal analyzer from Microsanj allows semiconductor device designers to gather thermal performance data with 800-ps resolution.

Part of the Thermoreflectance Nanotherm series, the NT410A offers megapixel full-field thermal images with submicron spatial resolution and 1 °C temperature resolution. The system is based on the optical thermoreflectance principle coupled with digital signal processing and advanced software algorithms.

Detailed thermal performance data helps ensure long-term device reliability and enables more optimal designs of ultrafast logic devices, fast-pulsed radar components and other high-speed semiconductor devices.


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AmericasTest & MeasurementCaliforniaProductssemiconductorthermal analysisthermal imagingMicrosanjthermoreflectance

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