Dec 2014Microsanj LLCRequest Info
SANTA CLARA, Calif., Oct. 1, 2014 — A new optical thermal analyzer from Microsanj allows semiconductor device designers to gather thermal performance data with 800-ps resolution.
Part of the Thermoreflectance Nanotherm series, the NT410A offers megapixel full-field thermal images with submicron spatial resolution and 1 °C temperature resolution. The system is based on the optical thermoreflectance principle coupled with digital signal processing and advanced software algorithms.
Detailed thermal performance data helps ensure long-term device reliability and enables more optimal designs of ultrafast logic devices, fast-pulsed radar components and other high-speed semiconductor devices.