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Film Thickness Measurement

Photonics Spectra
Dec 2014
CRAIC TechnologiesRequest Info
SAN DIMAS, Calif., Oct. 14, 2014 — Craic Technologies' FilmPro software can analyze a broad range of films on both transparent and opaque substrates and can be used with microspectrometers to measure the thickness of thin films via reflectance or transmission.

The software can measure thin-film thickness on semiconductors, microelectromechanical systems (MEMS), disk drives, flat-panel displays and more. Sampling areas can range from more than 100 µm across to <1 µm.

The software is designed for both research and production environments.


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