Oct 2014Olympus Scientific Solutions Americas, Industrial MicroscopesRequest Info
CENTER VALLEY, Pa., Oct. 28, 2014 — Designed for the accurate measurement of processed industrial materials, the STM7 measuring microscope from Olympus provides efficient inspection and simple operation.
The STM7’s large square stage can accommodate a number of printed circuit boards or semiconductor wafers without orientation shift. It features a durable, vibration-resistant frame with a granite surface plate. Measurements can be taken at submicron levels with minimal error.
The device uses the UIS2 infinity-corrected observation system and is able to observe brightfield, darkfield, DIC and POL images at high resolution and high contrast, with elimination of aberration.