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Measuring Microscope

Photonics.com
Oct 2014
Olympus Scientific Solutions Americas, Industrial MicroscopesRequest Info
 
CENTER VALLEY, Pa., Oct. 28, 2014 — Designed for the accurate measurement of processed industrial materials, the STM7 measuring microscope from Olympus provides efficient inspection and simple operation.

The STM7’s large square stage can accommodate a number of printed circuit boards or semiconductor wafers without orientation shift. It features a durable, vibration-resistant frame with a granite surface plate. Measurements can be taken at submicron levels with minimal error.

The device uses the UIS2 infinity-corrected observation system and is able to observe brightfield, darkfield, DIC and POL images at high resolution and high contrast, with elimination of aberration.


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