Diffractive Beam Samplers
Dec 2014Laser Components GmbHRequest Info
OLCHING, Germany, Dec. 16, 2014 — New diffractive beam samplers from Laser Components GmbH enable laser measurement without affecting the processing beam.
Available for wavelengths from 193 nm to 10.6 µm, the samplers create at least two perfect copies of the beam, allowing power and beam profile measurements to be carried out simultaneously.
Approximately 99 percent of the main beam is transmitted through the diffractive optical element without changing; the remaining 1 percent is split into higher orders for measurement purposes. The intensity of all partial beams do not depend on the polarization of the laser.