Swept Laser Test System
Mar 2015Santec Corp.Request Info
KOMAKI, Japan, March 20, 2015 — Santec Corp. has introduced the Swept Laser Test System for photonic testing. Its applications include optical component and module characterization, photonic materials characterization and optical spectroscopy.
The system combines the company’s proprietary TSL-510 or TSL-710 tunable laser with a power meter, polarization control unit and custom software.
The system optimizes wavelength-dependent loss and polarization-dependent loss measurement for both R&D and production environments. It uses real-time referencing while simultaneously acquiring output power from the laser and the transmitted optical power through the device under test. The Mueller matrix method is used to generate polarization-dependent loss measurements.