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Thermal Cameras

Photonics Spectra
Jul 2015
FLIR SystemsRequest Info
MEER, Belgium — Flir A6200sc NIRFlir Systems Inc.’s three new science-grade thermal cameras are designed for a variety of applications, including electronics development and nondestructive testing. The cooled devices’ high image quality, standardized interfaces and MATLAB integration enable thermal data acquisition.

The cameras use a standard GigE Vision interface to transmit full-dynamic-range digital video, and GenICam for camera control, providing plug-and-play capability. Users can stream temperature-calibrated data over Gigabit Ethernet to a PC to view and record live images. Simultaneously active and independently controlled, the video interfaces give users flexibility when recording and displaying thermal data.

The A6200sc NIR (pictured) features a 640 × 512-pixel resolution InGaAs detector producing near-infrared images for applications in laser beam profiling, art restoration, solar cell inspection and astronomy.

The A8300sc HD MWIR, a midwave infrared camera with a 1280 × 720-pixel resolution InSb detector, delivers high-definition images for applications in thermal electronics inspection, thermal microscopy, nondestructive materials testing, failure analysis, aerial thermal mapping and industrial research and development applications.

The A6700sc LWIR strained-layer superlattice detector produces 640 × 512-pixel resolution longwave infrared thermal imagery. It is suited for automotive testing, as well as university and industrial R&D applications.

The company’s ResearchIR version 4.20 software, incorporated in the cameras, enables users to monitor, acquire, analyze and share thermal data.


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The scientific observation of celestial radiation that has reached the vicinity of Earth, and the interpretation of these observations to determine the characteristics of the extraterrestrial bodies and phenomena that have emitted the radiation.
thermal imaging
The process of producing a visible two-dimensional image of a scene that is dependent on differences in thermal or infrared radiation from the scene reaching the aperture of the imaging device.
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