Noncontact Surface Profiler
Apr 2015Taylor Hobson Ltd.Request Info
LEICESTER, UK, April 13, 2015 — Taylor Hobson Ltd. has announced a new noncontact profiler for quantitative measurements of 3-D form and roughness features.
Based on coherence correlation interferometry (CCI) technology, the CCI MP-L provides nanometer resolution and a large field of view.
It features a 1024 × 1024-pixel array and a closed-loop, piezoless Z-axis scanner to provide a 500-μm vertical range.
The device can be used to measure wear, lubrication, corrosion, structured surfaces, medical implants, bearing roughness, crankshaft finish, textured steel, paper and toner.