Request InfoTaylor Hobson Ltd.Taylor Hobson Ltd. has announced a new noncontact profiler for quantitative measurements of 3-D form and roughness features. Based on coherence correlation interferometry (CCI) technology, the CCI MP-L provides nanometer resolution and a large field of view. It features a 1024 × 1024-pixel array and a closed-loop, piezoless Z-axis scanner to provide a 500-μm vertical range. The device can be used to measure wear, lubrication, corrosion, structured surfaces, medical implants, bearing roughness, crankshaft finish, textured steel, paper and toner.See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 11/1/2023Interlocked Control SystemThe Lasermet ICS-7 ALF from Lasermet is a compact version of the ICS-7 OEM interlocked control system. 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Tell...Photonics Buyers' GuideSORL/Space Optics Research Labs LLCSORL/Space Optics Research Labs produces high quality aspheric optical systems and instrumentation for a wide range of research and test applications. We also produce a wide range of reflective...