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Inspection Camera

Photonics.com
Jun 2015
Adimec Advanced Image Systems BVRequest Info
 
EINDHOVEN, Netherlands, June 24, 2015 — The Sapphire S-25A70/CXP camera from Adimec Advanced Imaging Systems BV combines 25-MP imaging with 73-fps performance to produce reliable, high-quality images.

Enabling the measurement of small critical structures or defects, the camera provides the increased accuracy and throughput required by in-line optical metrology systems. Its CoaXPress V1.1 Quad interface utilizes a 2-gigapixel-per-second camera platform. The On Semiconductor Vita25k global shutter image sensor delivers images of 5120 &mult; 5120 pixels.

A defect pixel correction algorithm is used to maintain high image uniformity.


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GLOSSARY
metrology
The science of measurement, particularly of lengths and angles.
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