Optical Metrology System
Sep 2015Fries Research & Technology (FRT) GmbHRequest Info
BERGISCH GLADBACH, Germany, Sept. 30, 2015 — FRT Fries Research & Technology GmbH has announced the MicroProf 100 optical metrology system with multisensor technology.
Point and area sensor integration allows the investigation of a range of surfaces from smooth to rough and matte to transparent. Depending on the dimensions, up to three sensors and a camera can be installed.
The MicroProf 100 can be extended for double-sided sample inspection and determining sample thickness during the same measurement process. The XY table travel range is 150 × 100 mm, suitable for the individual measurement of small parts in tray during production. The tabletop system can also be used in R&D labs.