Request InfoAdvantest Corp.Advantest Corp. has announced a time-domain reflectometry option for its TS9000 series of terahertz analysis systems, enabling the analysis of circuit quality in semiconductors, printed substrates and electronic components. The devices use time-domain reflectometry (TDR) and time-domain transmissometry (TDT) measurement technology to pinpoint and map circuit defects using short-pulse signal processing. 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