Optical Inspection System
Nov 2015Saki America Inc.
FREMONT, Calif., Nov. 3, 2015 — Optical inspection systems from Saki America Inc. feature a newly designed gantry and come in three configurations and sizes, with a dual-lane model and a 3D scanning head with side camera option.
The systems provide measurements with 1-μm resolution for components with heights up to 20 mm. It can be used to captures printed circuit board defects such as lifted leads, tombstones, reverses and height variations.