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Wavelength Test Station

Photonics.com
Nov 2015
McPhersonRequest Info
 
CHELMSFORD, Mass., Nov 20, 2015 — Wavelength Test StationThe STS spectral test station from McPherson Inc. is designed for wavelength testing and calibration from the longwave-infrared to 200 nm and less.

Discrete, high-purity wavelength bands are delivered to devices under test, helping characterize the response of sensors. The STS enables spectral test and characterization of diverse sensor and seeker formats including high-tech imaging and hyperspectral and electro-optical tracking sensors.

A research-grade, short-wavelength spectrometer is used to accommodate vacuum and extreme-ultraviolet applications. Sensor testing, process control and ground-based calibration of flight sensors are possible.


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