Request InfoMcPHERSONCHELMSFORD, Mass., Nov 20, 2015 — The STS spectral test station from McPherson Inc. is designed for wavelength testing and calibration from the longwave-infrared to 200 nm and less. Discrete, high-purity wavelength bands are delivered to devices under test, helping characterize the response of sensors. The STS enables spectral test and characterization of diverse sensor and seeker formats including high-tech imaging and hyperspectral and electro-optical tracking sensors. A research-grade, short-wavelength spectrometer is used to accommodate vacuum and extreme-ultraviolet applications. 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