Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

Wafer Probing Service

EuroPhotonics
Mar 2016
VI Systems GmbHRequest Info
 
BERLIN — VI Systems GmbH offers high-speed electrical and optical testing of wafers early in the manufacturing process using a semiautomatic wafer probing station.

The system reduces manufacturing costs by eliminating out-of-specification wafers before they have been cut and packaged to improve yield.

It also offers high-speed characterization at the wafer level. Test parameters include optical output power and optical spectrum. Electrical parameters include operation voltage, bias voltage, drive current and dark current. In addition, a high-frequency characterization test of up to 38 GHz can be performed including digital transmission experiments of up to 64 Gb/s.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
Photonics Buyers' Guide
Looking for Optical Testing? There are 37 companies listed in the Photonics Buyers' Guide.
Browse Cameras & Imaging, Lasers, Optical Components, Test & Measurement, and more.
ProductsVI SystemsindustrialsemiconductorsTest & MeasurementEuropeGermanyservices

Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2017 Photonics Media
x Subscribe to EuroPhotonics magazine - FREE!
X
Are you interested in this product?
If you'd like VI Systems GmbH to reach out to you with more information about this product, please supply your email and they will contact you.

Email Address:
Stop showing me this for the remainder of my visit