Atomic Force Microscope
Feb 2016Bruker Optics Inc.Request Info
BILLERICA, Mass, Feb. 3, 2016 — The MultiMode 8 atomic force microscope (AFM) from Bruker Corp. enables researchers to create high-resolution images and perform nanoscale, electrical and mechanical property mapping.
PeakForce Tapping permits the use of greatly reduced imaging forces, leading to consistent, high-resolution AFM imaging, from the softest biological samples to very hard materials. Quantitative nanomechanical mapping extends to 4 kHz, with modulation frequency doubling PeakForce imaging speeds. Quantitative work function maps with millivolt sensitivity at the 10-nm resolution level.
The MultiMode 8-HR is designed with high-rate PeakForce Tapping capabilities, while the MultiMode 8 base configuration is designed for lower budgets.