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Microscopy Compatibility
May 2016
WITec GmbHRequest Info
ULM, Germany, May 11, 2016 — Microscopy CompatibilityWitec GmbH has announced the compatibility of its Rise Microscopy Mode with the Zeiss MERLIN scanning electron microscope.

The hybrid system was developed to bring together Raman spectroscopic imaging and advanced ultrastructural analysis. The sample stage is placed within the microscope’s vacuum chamber, where the sample can remain for both measurements, easily transferred between the Raman and microscope measuring positions by a software-driven, push-button mechanism using an extremely precise scan stage.

The combined system provides all functions and features of a standalone Zeiss scanning electron microscope and a Witec confocal Raman microscope.


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ProductsRise Microscopy ModeMicroscopy CompatibilityWITecEuropeimagingSEMRaman spectroscopyinspectionconfocal microscopyMicroscopyZeissMerlin

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