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X-Ray Goniometry Service

Photonics.com
May 2016
Meller Optics Inc.Request Info
 
PROVIDENCE, R.I., May 24, 2016 — goniometry serviceMeller Optics Inc. has announced its X-Ray Goniometry Service, providing a complete lattice orientation of single crystals.

Measurement of lattice orientation is provided with precision up to 1/100° and provides a misalignment report of tilt and azimuth. Capable of machine marking the orientation and applying a reference flat, the service can be performed with material samples ranging from 0.25 in.2 up to 20 kg ingots.

Ideal for sapphire, single-crystal quartz, silicon, MgF2, CaF2, BaF2, spinel and other materials, the X-Ray Goniometry Service is typically performed to validate orientation when thermal expansion, coefficient and the index of refraction needs to be constant in all directions, and when birefringence must be minimum or maximum, and polarization effects are critical.


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