Request InfoNanoFocus AGOBERHAUSEN, Germany, June 13, 2016 — Nanofocus AG has introduced the μsprint hp-opc 3000 system for the optical inspection of probe cards. The system enables a wafer-production process designed for the requirements of wafer test locations with a variety of different probe cards, as well as large-volume throughput. Probe cards are test devices used for standard function tests of wafers at the end of the front-end process, after the functional structures of the electronic elements on a wafer are fully manufactured. The μsprint hp-opc 3000 system can be used to ensure wafers are in sound condition after testing, for...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra August 2023 IssueWarpage Metrology ToolThe Wave3000 warpage metrology tool from ERS electronic GmbH is designed for advanced packaging wafers and the semiconductor manufacturing industry. 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