Atom Probe Microscope
Jun 2016Cameca SASRequest Info
GENNEVILLIERS, France, June 16, 2016 — Cameca has announced the Eikos atom probe microscope, providing accessibility with increased ease-of-use and low cost of ownership.
Utilizing standard microscopy sample preparation methods, it delivers nanoscale structural information that is expected to yield a greater understanding of materials for research and faster development of products for industrial applications. It features an integrated counter electrode, which eliminates the need for in-situ alignment, and a 532-nm laser pulse system.
Applications include metals, nuclear structural materials, thin films and coatings.