Request InfoHORIBAHoriba Scientific has announced a differential interferometry profiling (DIP) system for depth profiling in glow discharge optical emission spectrometry (GD-OES). GD-OES is a technique for fast, multi-elemental depth profiling of conductive and nonconductive materials. GD-OES relies on plasma for the sputtering of a representative area of the investigated specimen and on a high resolution spectrometer for the simultaneous measurement of all elements of interest. DIP provides real-time layer thickness, crater depth and sputter rate without calibration. The new instrument capability...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 3/15/2024Corrosion and Weld ScannersThe MapROVER™ (shown) and SteerROVER™ from Evident Corporation are phased array inspection solutions for weld and corrosion inspections. 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