Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
Photonics Media
ABOUT US
BOOKSTORE
SUBSCRIBE
ADVERTISE
Facebook Twitter Instagram LinkedIn YouTube RSS
More News
share
Email Facebook Twitter Google+ LinkedIn

Automated Metrology System

Photonics.com
Jul 2016EV Group (EVG)Request Info
 
ST. FLORIAN, Austria, July 13, 2016 — Automated Metrology SystemEV Group has announced the EVG 50 automated metrology system, designed to support stringent manufacturing requirements for advanced packaging, MEMS and photonics applications.

The EVG 50 performs high-resolution, nondestructive, multilayer thickness and topography measurement, as well as void detection, in bonded wafer stacks and photoresists used in optical lithography.

The system measures layers down to 2 μm in thickness, inspects up to 1 million points and achieves throughputs of up to 55 300-mm wafers/hour. This combination of extremely high resolution and high throughput provides cost-efficient full-wafer inspection that enables device manufacturers to improve their wafer bonding and lithography processes, as well as achieve higher yields.

Visit company website
About this supplier

explore related content
REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to EV Group (EVG) by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
more related
YOU MAY ALSO LIKE...
Wafer Bonding Aligner
3D Line Scan Camera
3D Measuring Laser Microscope
Solder Paste Inspection System
MORE FROM PHOTONICS MEDIA
Products
3D Optical Profilers
Europe
Line-Scan Camera
inspection
Wafer Inspection System
industrial
Industrial Cameras
Photonics Buyers' Guide
Looking for MEMS? There are 21 companies listed in the Photonics Buyers' Guide.
Browse Cameras & Imaging, Lasers, Optical Components, Test & Measurement, and more.
ProductsEVG50automated metrology systemEV GroupEuropeinspectionmetrologyTest & Measurementindustrial

Terms & Conditions Privacy Policy About Us Contact Us
Our Publications Photonics Spectra BioPhotonics Industrial Photonics EuroPhotonics Photonics Showcase Photonics Buyers' Guide Photonics Handbook Photonics Dictionary E-Newsletters
Sections News Features Products White Papers Media Light Matters Newscast Webinars Events & Courses Calendar
Browse by Subject Lasers Optics Imaging Biophotonics Industrial Sensors & Detectors Test & Measurement Light Sources Fiber Optics Spectroscopy Microscopy Materials & Coatings
Services Subscribe Login Register Advertise Submit a Press Release List in the Buyers' Guide Buy Wall Charts Terms & Conditions Privacy Policy About Us Contact Us
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
X
Are you interested in this product?
When you click "Send Request", we will send the contact details you supply to EV Group (EVG) so they may respond to your inquiry directly.

Email Address:
Name:
Company:
Stop showing me this for the remainder of my visit
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.