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Inspection System
Jul 2016
Nanotronics Imaging
SAN FRANCISCO, July 19, 2016 — Inspection System Nanotronics offers the nSpec 2.0, a comprehensive inspection system for fabrication plants and laboratories. The system features advanced machine learning and image processing algorithms that analyze fully patterned wafers and large devices.

The device can locate and classify any feature or defect, from subnanometer through millimeters and centimeters, in materials that are transparent, semitransparent and opaque, and at every stage of production.

ProductsAmericasSan FranciscoCalifornianspec 2.0Nanotronicsimaginginspectionindustrialmachine visionAIimage processingmaterialsmaterials processing

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