Microscopy Simplification System
Jul 2016Hitachi High-Technologies Corp.Request Info
TOKYO, July 29, 2016 — Hitachi High-Technologies Corp. has announced the MirrorCLEM system for simplifying correlative light and electron microscopy.
The system supports quick and accurate correlative light electron microscopy (CLEM) analysis by using a field emission scanning electron microscope (FE-SEM). With this system, the plastic sections can be observed under a light microscope from low magnifications to magnifications that are high enough to clearly observe the structure of interest. In addition, the FE-SEM stage can be coordinated to the target position in the low-magnification image which is observed with the light microscope.
The field of view in a FE-SEM can move to any region of interest in the image and the same field can be observed in the FE-SEM under the MirrorCLEM system. The system is capable of displaying an overlay of the light microscope and FE-SEM images in real time.