Birefringence Microscopic Imager
Hinds Instruments Inc.Request Info
Optics & Photonics 2016 Booth: 109
The Exicor® MicroImager birefringence imaging solution can measure retardance from 2 nm to 327.5 nm of retardance in 10 seconds. Using Hinds Instruments’ Phase Unwrapping technology and our 4 wavelength system, you can measure up to 3500 nm of retardance for highly birefringence samples. View samples down to 0.7 µm in spatial resolution. Useful in measurement of: diamonds, biologicals, optics, films, polymers, liquid crystals, and other organic and inorganic samples.
https://www.hindsinstruments.com/products
/Buyers_Guide/Hinds_Instruments_Inc/c6111
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