Aug 2016Nanophoton Corp.Request Info
OSAKA, Japan, Aug. 12, 2016 — Nanophoton Corp. has announced the RAMANdrive wafer analyzer with sub-μm resolution.
The device provides stress, polytype and defect distributions in three dimensions. The 300-mm stage was developed for accurate and safe analysis of the whole wafer, while the Raman imaging system provide high-performance data.
Data is implemented from the regular inspection system and used to move the wafer to all positions for a detailed analysis. The RAMANdrive uses high-quality dark-field microscopy to easily localize particles smaller than 100 nm.