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Combination Optical Tweezer and Atomic Force Microscope

Mar 2017
JPK Instruments AGRequest Info
BERLIN — Combination Optical Tweezer and Atomic Force MicroscopeThe OT-AFM Combi-System from JPK Instruments AG combined system to provide optical tweezers and atomic force microscopy on a single inverted light microscope platform.

The OT-AFM ConnectorStage is the key to combining any atomic force microscope of the NanoWizard or CellHesion family with the NanoTracker optical tweezers on a research-grade inverted optical microscope. Dynamic processes can be controlled with the non-invasive power of light while data is simultaneously being collected with the microscope.

Single molecules and living cells can be manipulated in 3D with additional degrees of freedom in force measurement. Dual force measurement applications are supported by JPK's camera-based OT force detection system.


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