Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

Fault Localization and Transistor Characterization Tool

Photonics.com
Jan 2017
Thermo Fisher Scientific Inc.Request Info
 
FORTH WORTH, Texas, Jan. 10, 2017 — The nProber III fault localization and transistor characterization tool from Thermo Fisher Scientific Inc. provides process development and failure analysis down to the 7-nm technology node.

The nProber III allows failure analysis engineers to find and characterize individual devices preparatory to extracting thin sectional samples for physical failure analysis in transmission electron microscopy.

The nProber III doubles the resolution and probe stability over its predecessor.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
ProductsnProber IIIfault localization and transistor characterization toolThermo Fisher ScientificAmericasMicroscopy

Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2017 Photonics Media
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
X
Are you interested in this product?
If you'd like Thermo Fisher Scientific Inc. to reach out to you with more information about this product, please supply your email and they will contact you.

Email Address:
Stop showing me this for the remainder of my visit