OPTICAL MATERIALS CHARACTERIZATION
May 2000Hinds Instruments Inc.Request Info
A birefringence measuring system for characterizing optical materials is available from Hinds Instruments Inc. The Exicor 150AT measures the retardation of linear birefringence with ±0.005-nm sensitivity and the direction of birefringence with an accuracy of <1° for retardance greater than 0.5 nm. It uses a polarization modulation technique that provides 1-s measuring times and 50-kHz modulation frequency. The standard instrument can accept optical samples up to 6 x 6 in., with an option for 12 x 12-in. samples. The device maps materials from the ultraviolet to the infrared, displaying data in 2- and 3-D images. Applications include quality control metrology; qualification of semiconductor photolithography components such as calcium fluoride windows, fused-silica optics and stepper reticles; and low-level birefringence measurements of plate glass, scientific optical components, digital videodiscs and laser crystals.