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3D Surface Metrology System

Photonics.com
Oct 2017
Sensofar MetrologyRequest Info
 
BARCELONA, Spain, Oct. 5, 2017 — 3D Surface Metrology SystemThe Five Axis 3D noncontact 3D surface metrology system from Sensofar Metrology is a 3D optical profiler that combines a high-accuracy rotational module and a high-resolution translation platform with advanced inspection and analysis capabilities.

The system enables automated 3D surface measurements at defined positions that combine to create full 3D volumetric measurements, which are ideal for micromachining, additive manufacturing, tooling and medical technology applications. The Five Axis also integrates several special acquisition modes designed to complement and exploit the capabilities of the motion system.

Manual mode measures individual fields of view with high-accuracy positioning, while grid mode can capture individual fields of view at several different positions. Three-dimensional mode is an automated procedure using a five-multiple recipe that combines five-axis positions and measurement acquisition to obtain a 3D topography in the STL file format.


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ProductsFive Axis3D surface metrology systemSensofar MetrologymetrologyinspextionEuropeindustrial

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