THIN-FILM MEASUREMENT
Filmetrics, KLA InstrumentsRequest Info
Filmetrics Inc. has introduced two systems for nondestructive measurement of samples on curved surfaces. The products measure two-layer structures and optical constants. The F20-CP is designed to measure translucent or clear reflective coatings and curved surfaces of film up to 50 µm thick, while the F20-XT, with the CP-NIR contact probe attachment, can measure film up to 100 µm thick. The systems require no sample preparation and can fit on a desktop. They also sample with accuracy to within 1% in less than 1 s and either on- or off-line.
https://www.filmetrics.com
/Buyers_Guide/Filmetrics_KLA_Instruments/c4936
Published: September 2000
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