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20/20 Solar PV Cell Testing

Photonics.com
Jul 2010
CRAIC TechnologiesRequest Info
 
SAN DIMAS, Calif., July 6, 2010 — For solar photovoltaic (PV) cell testing applications, Craic Technologies Inc. has released the 20/20 Solar microspectrophotometer that is designed to measure the thickness of thin films as well as the optical efficiencies and clarity of photovoltaic cells. This can be done by both transmission and reflectance, whether the solar cells are the traditional crystalline silicon substrates or one of the thin-film varieties. Protective glasses and concentrator modules also can be analyzed for their efficiency.

The device can be combined with proprietary contamination imaging capabilities to locate and identify process contaminants. It combines advanced microspectroscopy with sophisticated software to enable the user to measure transmissivity, reflectivity and luminescence. It can determine the thin-film thickness of many types of materials and substrates and can measure the transmissivity and reflectivity from many of the components used to manufacture PV cells, such as concentrators.

Sampling areas can range from >100 µm across to <1 µm. Designed for the production environment, the microspectrophotometer features a number of easily modified metrology recipes, the ability to measure new films and materials, sophisticated tools for analyzing data, and options for automation including touch-screen control. Other features such as contamination analysis can be added to the instrument.


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