Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

20/30 XL Microspectrophotometer

Photonics.com
Sep 2013
CRAIC TechnologiesRequest Info
 
SAN DIMAS, Calif., Sept. 3, 2013 — Craic Technologies has introduced the 20/30 XL microspectrophotometer for taking spectra and images of microscopic features of large objects from the deep-UV to the near-infrared. Its various laboratory and manufacturing applications include mapping color and intensity variations of flat panel displays, measuring film thickness across the entire surface of 300-mm wafers, scanning the surfaces of hard disks for defects, and analyzing entire paintings with high spatial resolution.

The instrument integrates advanced spectrophotometers with a UV-VIS-NIR microscope and software. Its flexible design attaches to big frames that can accommodate large-scale samples. The spectral range of the device enables it to analyze samples using spectroscopy techniques such as absorbance, reflectance, Raman, luminescence and fluorescence.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to CRAIC Technologies by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
MORE FROM PHOTONICS MEDIA
light sources
20/30 XL microspectrophotometerabsorbance spectroscopyAmericasartwork analysisCaliforniacolor mappingConsumerCraig TechnologiesDisplaysflat panel displaysflexible displaysfluorescence spectroscopyhard disk scanningimagingindustriallight sourcesluminescence spectroscopyMicroscopyopticsProductsRaman spectroscopyreflectance spectroscopywafer measurementWafers

Terms & Conditions Privacy Policy About Us Contact Us
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
X
Are you interested in this product?
When you click "Send Request", we will send the contact details you supply to CRAIC Technologies so they may respond to your inquiry directly.

Email Address:
Name:
Company:
Stop showing me this for the remainder of my visit
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.