20/20 UV-VIS-NIR Microspectrophotometer

CRAIC TechnologiesRequest Info
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SAN DIMAS, Calif., Feb. 24, 2010 – Craic Technologies Inc. has announced the 20/20 UV-VIS-NIR microspectrophotometer that incorporates the latest technological advances in optics, spectroscopy and software and is designed to nondestructively analyze many types of microscopic samples from the deep-ultraviolet to the near-infrared.

This flexible instrument acquires and analyzes data from microscopic samples smaller than 1 µm across — by absorbance, reflectance, emission, luminescence, polarization and fluorescence spectroscopy — with high speed and accuracy. It also can determine the thickness of thin films and color spaces and can perform color imaging.

Applications include forensic analysis of trace evidence, vitrinite reflectance of coal, spectral analysis of minerals, measurement of protein crystals, contamination analysis, and thin-film measurement of semiconductors, hard disks and flat panel displays. Other uses include MEMS (microelectromechanical systems) devices, surface plasmon resonance, photonic bandgap crystals, and drug and combinatorial chemistry. The instrument is calibrated using Standard Reference Materials from NIST.

The microspectrophotometer integrates an advanced spectrophotometer with a sophisticated UV-VIS-NIR range microscope and easy-to-use software. With high-resolution digital imaging, it also can be used as an ultraviolet or infrared microscope. Features include touch screen controls, calibrated variable apertures, high sensitivity, a durable design, automation, ease-of-use, and multiple imaging and spectroscopic techniques. An integrated thermoelectrically cooled array detector ensures low noise and long-term stability.

Published: February 2010
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20/20 microspectrophotometerabsorbanceBasic Sciencecalibrated variable aperturescolor imagingcombinatorial chemistryConsumercontamination analysisCraic Technologiesdigital imagingdrug chemistryemissionflat-panel displaysfluorescenceforensicshard disksImagingluminescenceMEMSMicroscopymineralsnanoNISTnondestructive analysisphotonic bandgap crystalspolarizationProductsprotein crystalsReflectancesemiconductorsSensors & DetectorsSoftwaresurface plasmon resonanceTEC arrayTest & Measurementthin-film measurementtouch screen controlsUV/VIS/NIRvitrinite reflectance

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