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785-nm Raman Spectrograph

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For Low-Intensity Applications
The Acton LS 785 Raman spectrograph from Princeton Instruments (PI) is optimized for the near-infrared (NIR). A proprietary refractive, five-element f/2 lens design produces the highest quality imaging and field flatness for spectroscopic analysis in the 700- to 1000-nm region.

A unique antireflection coating developed by the Acton Optics Coating Laboratory ensures 99.4-percent transmission per element over the working spectral range. The standard configuration includes a gold-coated grating.

Acton_LS.jpgRoy Grayzel, PI's spectroscopy product manager, said, “We have combined our years of knowledge within the Raman market with our extensive experience of using optics in spectroscopy, to bring a lens spectrograph to the market with the highest throughput and best imaging performance available for Raman studies in the NIR."

The Acton LS 785 achieves 5-wave-number resolution or better over its entire working range. The grating may be rotated via a micrometer and locked for the appropriate spectral coverage for use with the 650- to 830-nm lasers typically used in NIR Raman spectroscopy.

An integrated optional edge filter with better than 8-OD (optical density) laser line rejection can be incorporated into the collimating lens assembly to provide stray light rejection performance to approximately 250 wave numbers from the laser line.

The compact, rugged design has no moving parts and is suitable for applications requiring transportability and limited accessibility.

Used with one of PI’s NIR-enhanced CCD or ICCD cameras, the Acton LS 785 creates a sensitive, reliable NIR Raman spectrometer system.

For more information, visit: www.piacton.com; e-mail: [email protected]

Princeton Instruments/Acton
3660 Quakerbridge Rd.
Trenton, NJ 08619
Phone: (609) 587-9797
Toll-free: (877) 4-PIACTON
Fax: (609) 587-1970




Published: May 2007
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Acton LS 785Acton OpticsBiophotonicsf/2 lensFiltersglassk Raman spectrographlensesNIROpticsphotonicsPrinceton InstrumentsProductsspectroscopic analysisspectroscopy

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