Apollo XLT SDD Series for TEMS
Photonics.com
Feb 2011EDAX Inc., Materials Analysis Div.Request Info
MAHWAH, N.J., Feb. 14, 2011 — Edax Inc. has released the Apollo silicon drift detector (SDD) series for transmission electron microscopes (TEMs). The series includes the Apollo XLT with a super-ultrathin window and the Apollo XLTW, a windowless version.
Data acquisition and signal processing electronics are fully integrated into the detector. The Apollo XLT detector eliminates the need for a separate electronics enclosure for signal processors. The integrated detector design improves performance, facilitates installation and offers easy remote access via Ethernet from virtually any computer.
The series offers good collection efficiency with a 30 mm2 sensor for TEM applications. The windowless version further maximizes the collection efficiency and improves sensitivity up to 500% for low-energy x-rays. As a result, the mapping speed and light element detection in low concentrations are greatly enhanced.
The series is offered with Team energy dispersive spectroscopy software to provide an analytical solution for the TEM. The software is built with a modern interface that optimizes the display area for results and quick access to all features. It includes smart features that provide good analytical intelligence, enabling users to obtain higher quality and more reliable results. Among these features are “smart track,” “smart acquisition,” “smart phase mapping” and “smart data review.”
To optimize results for thin samples, Expert ID and MThin have been implemented in the software. Expert ID is a peak identification program, and MThin is a precise quantification algorithm for thin materials.
The company says that the smart features make the system more intuitive and easier to use, ensuring good results every time, regardless of operator skill.
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