Atom Probe Microscope

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Atom Probe MicroscopeThe EIKOS-UV atom probe microscope from Cameca utilizes standard microscopy sample preparation methods and delivers nanoscale structural information for R&D and industrial applications

The EIKOS-UV is available in two configurations: the base EIKOS system, which incorporates a reflectron spectrometer design to provide excellent mass resolving power and signal to noise with a voltage pulsing system, and the fully configured EIKOS-UV system, which adds an integrated, automated laser pulsing module with computer-controlled focused spot design.

Applications include metals, semiconductors, functional materials, minerals, nuclear structural materials, thin films and coatings. Its standard specimen preparation methods and mature data analysis routines also make it a cost-effective workhorse instrument for nanoscale materials research and industrial materials development.

Published: August 2019
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ProductsEIKOS-UVatom probe microscopeCamecaAmetekMicroscopyMaterialsCoatingsnanoindustrialR&DAmericas

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