Search
Menu
Meadowlark Optics - SEE WHAT

Atomic Force Microscope

Oxford Instruments Asylum ResearchRequest Info
 
Facebook X LinkedIn Email
Asylum Research’s new MFP-3D Origin atomic force microscope (AFM) has full upgrade potential to the MFP-3D and its complete range of environmental and advanced application accessories.

The MFP-3D features closed-loop precision, high-resolution imaging and low-noise force measurements. The MFP-3D Origin includes advanced modes such as nanolithography, the proprietary Dual AC mode and piezoresponse force microscopy. Additional advanced functionality is available for optional modes such as conductive AFM, AM-FM viscoelastic mapping for nanomechanical analysis, scanning tunnelling microscopy and scanning thermal microscopy.


Published: May 2013
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to Oxford Instruments Asylum Research by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

AFMAmericasAsylum ResearchBasic ScienceCaliforniaImagingindustrialMFP-3D Origin atomic force microscopeMicroscopynanonanolithographyNew ProductsOpticspiezoresponse force microscopyProductsscanning thermal microscopescanning tunneling microscopesTest & Measurementviscoelastic mapping

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.