Atomic Force Microscope

Bruker Nano SurfacesRequest Info

The Dimension FastScan atomic force microscope (AFM) from Bruker Corp. delivers good imaging speed without sacrificing nanoscale resolution. It produces results in seconds or minutes instead of hours or days. The system performs large-sample atomic-scale imaging across the scientific, biological, semiconductor, data storage and energy research markets. Innovations enable fast scan speeds, high image resolution and accuracy. Based upon the Dimension Icon AFM architecture, the microscope is a tip-scanning system that provides measurements on large and small samples in air or fluids. The system uses an X-Y-Z closed-loop head that scans at high speeds while delivering low drift and low noise. A new fast scanner, a high-resolution camera, automated laser and detector alignment, and integrated feedback alignment tools deliver fast probe positioning and sample navigation.

Visit company website

About this supplier

explore related content

Photonics Spectra
Jul 2011

REQUEST INFO ABOUT THIS PRODUCT

* Message:

(requirements, questions for supplier)

Your contact information

* First Name:

* Last Name:

* Email Address:

* Company:

Address:

Address 2:

City:

State/Province:

Postal Code:

* Country:

Phone #:

Fax #:

Register or login to auto-populate this form:

Login Register

* Required

When you click "Send Request", we will record and send your personal contact information to Bruker Nano Surfaces by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Browse Cameras & Imaging, Lasers, Optical Components, Test & Measurement, and more.

Menu

Search

Atomic Force Microscope