Atomic Force Microscopy Probes

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SANTA BARBARA, Calif., April 5, 2017 — Atomic Force Microscopy ProbesSurfRider HQ-Series Atomic Force Microscopy Probes from Oxford Instruments Asylum Research Inc. are high-quality silicon probes for use in all commercially available atomic force microscopes.

Users can easily engage at the location of interest with controlled tip-to- cantilever registration. The vertical edges make the probes easier to handle with tweezers while reducing chipping. Models are available for all routine image modes such as tapping, force modulation and contact modes, as well as most of the nanomechanical modes.

The probes are an ideal choice for routine atomic force microscopy measurements, education environments or multi-user facilities.

Published: April 2017
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ProductsSurfRider HQ-SeriesAtomic Force Microscopy ProbesOxford Instruments Asylum ResearchAmericasMicroscopyImaging

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