Atomic Resolution Electron Microscope

JEOL USA Inc.Request Info
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TOKYO, April 2, 2020 — Atomic Resolution Electron MicroscopeThe JEM-ARM300F2 GRAND ARM2 atomic resolution electron microscope from JEOL Ltd. is an analytical device that provides high resolution and analysis with a high degree of accuracy.

The transmission electron microscope features the FHP2 pole-piece to achieve an optimal combination of atomic resolution imaging along with large, solid-angle energy dispersive x-ray spectroscopy elemental analysis. Guaranteed STEM resolution is 53 pm at 300 kV and 96 pm at 80 kV. The standard configuration of the microscope includes an enclosure that mitigates external disturbances.

Published: April 2020
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ProductsAtomic Resolution Electron MicroscopeJEOLMicroscopyImagingspectroscopyAsia-Pacific

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