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Axio CSM 700

Photonics.com
Oct 2009
Carl Zeiss Microscopy LLCRequest Info
 
Confocal Light Microscope
THORNWOOD, N.Y., Oct. 28, 2009 – Carl Zeiss MicroImaging Inc. has added new functions to its Axio CSM 700 confocal light microscope. Materials scientists now can measure 3-D topography over large sample areas with more convenience and flexibility.

CarlZeiss_Axio.jpgFor the microscope, the company offers a motorized scanning stage with a 150 × 150-mm travel range that is suitable for materials research, quality inspection and routine applications. Scanning stage control is integrated into the software and allows large sample areas to be captured in a mosaic fashion with high resolution. This function has been further optimized with a stitching algorithm so that no transitions are perceived between the single images in the final mosaic image. Therefore, roughness measurement can be determined with a higher statistical reliability, even with large sample areas.

Operation of the microscope has been made easier thanks to the new encoded and motorized objective nosepiece that now comes standard.

The instrument accurately measures even low roughness on relatively “soft” surfaces without contact. It visualizes surfaces three-dimensionally, with high resolution and in true color, enables precise measurement of 3-D microstructures and determines roughness. Topographical measurements can be performed at more than 100 fps. Additional benefits include reliable detection of height information with step heights from 20 nm up to the millimeter range, as well as images with a depth of focus otherwise possible only with scanning electron microscopes.

The easy-to-use software provides numerous analysis options, including measurement of roughness, evaluation of layer thickness and particle analysis. Additional functions such as a newly programmed filter facilitate and improve the image processing capabilities.

English units like inches and microinches have been integrated into the software, resulting in improved compliance with material microscopy standards valid in parts of North America, in particular.

For more information, visit: www.zeiss.com/micro  

Carl Zeiss MicroImaging Inc.
One Zeiss Drive
Thornwood, NY 10594
Phone: (800) 233-2343
Fax: (914) 681-7446


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